| Citation: |
ZHOU Xu-chang, TAN Ying, YANG Chun-zhang, LI Yan-hui, SU Shuan, QI Hang, GAO Li-hua, LI Dong-Sheng. Study on the Quantum Well Infrared Photodetector Material[J]. Infrared Technology , 2013, (8): 463-466.
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| [1] | YANG Chunzhang, QIN Gang, LI Yanhui, LI Da, KONG Jincheng. Research on Growth of M/L-wavelength Dual-band IR-MCT on CZT Substrate by MBE[J]. Infrared Technology , 2018, 40(1): 1-5. |
| [2] | QIN Gang, LI Dongsheng, LI Xiongjun, LI Yanhui, WANG Xiangqian, YANG Yan, TIE Xiaoying, ZUO Dafan, BO Junxiang. Research on the Technique of in-situ p-on-n MWIR-MCT by MBE[J]. Infrared Technology , 2016, 38(10): 820-824. |
| [3] | QIN Gang, LI Dong-sheng. The As-doping Technique of HgCdTe Thin Film by MBE[J]. Infrared Technology , 2015, (10): 858-863. |
| [4] | QIN Gang, LI Dong-sheng, LI Yan-hui, YANG Chun-zhang, ZHOU Xu-chang, ZHANG Yang, TAN Ying, ZUO Da-fan, QI Hang. Research on In-situ As-doped HgCdTe Thin Film Growth on Ge-base by MBE[J]. Infrared Technology , 2015, (2): 105-109. |
| [5] | SONG Li-Yuan, TANG Li-Bin, LI Yan-Hui, KONG Ling-De, CHEN Xue-Mei. The Study on the Properties of CdTe Buffer Layer for MBE HgCdTe Epilayer[J]. Infrared Technology , 2009, 31(11): 628-630,633. DOI: 10.3969/j.issn.1001-8891.2009.11.003 |
| [6] | ZHANG Kai, MA Yan, GUO Jing, WU Ju-ying. Preparation and Characterization of Low Infrared Emissivity Tenacity Coating[J]. Infrared Technology , 2009, 31(2): 87-89. DOI: 10.3969/j.issn.1001-8891.2009.02.006 |
| [7] | SU Shuan, LI Yan-hui, ZHOU Xu-chang, YANG Chun-zhang, TAN Ying, GAO Li-hua, LI Quan-bao. A Study of In Situ Annealing of MBE Growth Hg1-xCdxTe[J]. Infrared Technology , 2009, 31(1): 5-7. DOI: 10.3969/j.issn.1001-8891.2009.01.002 |
| [8] | ZHAO Jun, YANG Yu-lin, LI Yan-hui, SONG Li-yuan, JI Rong-bin. The Study of MBE Molecule Beam Based on the Ensemble Theory[J]. Infrared Technology , 2006, 28(8): 466-469. DOI: 10.3969/j.issn.1001-8891.2006.08.008 |
| [9] | Fabrication of Quantum Well Infrared Photodector Focal Plane Array Coupled with 2-D Diffraction Grating[J]. Infrared Technology , 2002, 24(6): 77-80,85. DOI: 10.3969/j.issn.1001-8891.2002.06.018 |
| [10] | Automatic Measurement System of Characterization of GaAs/AlGaAs QWIP[J]. Infrared Technology , 2001, 23(2): 8-10,16. DOI: 10.3969/j.issn.1001-8891.2001.02.003 |
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