| Citation: |
SUN Junwei, KONG Xiangsheng, HU Hanlin, LIU Jiwei, WANG Xingxiang, LI Songhua. Vacuum Life of Uncooled Infrared Detector[J]. Infrared Technology , 2024, 46(12): 1448-1452.
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Uncooled infrared detectors have been developed rapidly in the military and civil fields. The vacuum packaging of detectors affects the life of components, with vacuum failure being the most common failure mode. In this study, based on the ceramic packaging of an uncooled infrared detector, the packaging structure and technology were analyzed, and the effects of the getter area and glue thermal weight loss on the degree of vacuum in the detector were studied using the Arrhenius equation as an accelerated life model. The experimental results show that increasing the getter area and volume, as well as using glue with low TG parameters to reduce the release of volatile gases, helps maintain the vacuum degree inside the detector and prolongs its vacuum life. This study provides a reference for the vacuum packaging of uncooled infrared detectors.
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