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Volume 44 Issue 1
Jan.  2022
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XIONG Xiong, DUAN Yu, HU Mingdeng, LI Ruiping, DU Yu, MAO Jianhong. Reliability Research for 640×512 Miniaturized IR Detector Dewar Assembly[J]. Infrared Technology , 2022, 44(1): 89-95.
Citation: XIONG Xiong, DUAN Yu, HU Mingdeng, LI Ruiping, DU Yu, MAO Jianhong. Reliability Research for 640×512 Miniaturized IR Detector Dewar Assembly[J]. Infrared Technology , 2022, 44(1): 89-95.
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Reliability Research for 640×512 Miniaturized IR Detector Dewar Assembly

  • Zhejiang Juexin Microelectronics Co., Ltd., Lishui 323000, China

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  • Received Date: October 10, 2021
  • Revised Date: November 10, 2021
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    • Abstract
  • Driven by the concept of SWaP3 (Size, Weight, and Power, Performance and Price), the development of the third-generation cooled IR detectors is proceeding in the direction of high performance, miniaturization, and light weight. As core military electronic devices, the reliability of IR detectors has become the focus of research. In this study, based on the 640×512/15 μm miniaturized dewar developed by Zhejiang Juexin Microelectronics Co., Ltd., a systematic reliability research is carried out. This research involves four dimensions, namely mechanics, thermodynamics, remainders, and vacuum. The performance of the 640×512/15 μm miniaturized dewar is evaluated through reliability tests. The results show that the miniaturized dewar has high reliability to satisfy most military needs.
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    • References (14)
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