复合材料蜂窝夹层结构粘接缺陷红外对侧穿透式检测技术

Opposite-Side Transmission Infrared Thermography Technology for Bonding Defects in Composite Honeycomb Sandwich Structures

  • 摘要: 单侧红外检测时,热波需从试件表面传播至缺陷再返回试件表面,传播距离为缺陷深度的两倍,热波衰减严重,导致检测深度受限。为克服这一不足,本文提出一种基于大功率热源激励的红外对侧穿透式检测方案,将热源与红外热像仪置于试件两侧。通过对铺层为2 mm/28 mm/2 mm的复合材料蜂窝夹层结构进行实验,并优化加热功率、加热时间及采集延时等热加载参数,结果表明:对侧检测时热波仅需从缺陷单程传播至红外热像仪侧表面,可清晰识别结构内部及背面的脱粘缺陷,对Φ10 mm缺陷的检测灵敏度达100%。因此,红外对侧穿透式检测有效弥补了单侧检测因热波双程传播而导致的深度衰减问题,为较厚复合材料蜂窝结构的缺陷检测提供了一种高效、可靠的方法。

     

    Abstract: In single-sided infrared thermography, thermal waves must propagate from the specimen surface to the defect and back, traveling twice the defect depth. This results in severe attenuation and limits the detection depth. To overcome this limitation, this study proposes an opposite-side infrared detection scheme based on high-power thermal excitation with a heat source and an infrared camera placed on opposite sides of the specimen. Experiments were conducted on a composite honeycomb sandwich structure with a layup of 2 mm/28 mm/2 mm, and thermal excitation parameters, including heating power, duration, and acquisition delay, were optimized. The results show that in opposite-side detection, thermal waves travel only one way from the defect to the camera-side surface, enabling clear identification of internal and back-side debonding defects, with a detection sensitivity of 100% for Φ10 mm defects. Therefore, opposite-side transmission infrared detection effectively overcomes the depth attenuation issue caused by round-trip thermal wave propagation in single-sided detection, thereby providing an efficient and reliable method for defect detection in thick-composite honeycomb structures.

     

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