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ZHANG Qingyu, FAN Yugang, GAO Yang. Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering[J]. Infrared Technology , 2020, 42(10): 1001-1006.
Citation: ZHANG Qingyu, FAN Yugang, GAO Yang. Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering[J]. Infrared Technology , 2020, 42(10): 1001-1006.
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Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering

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  • Available Online: December 07, 2020
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