Study of the Dark Current Characteristics of Sub-pixel Structure HgCdTe Photovoltaic Detectors

QIAO Hui; LI Xiangyang

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Infrared Technology > 2017 > 39(6): 489-494.

QIAO Hui, LI Xiangyang. Study of the Dark Current Characteristics of Sub-pixel Structure HgCdTe Photovoltaic Detectors[J]. Infrared Technology , 2017, 39(6): 489-494.

Citation:

QIAO Hui, LI Xiangyang. Study of the Dark Current Characteristics of Sub-pixel Structure HgCdTe Photovoltaic Detectors[J]. Infrared Technology , 2017, 39(6): 489-494.

Citation:

QIAO Hui, LI Xiangyang. Study of the Dark Current Characteristics of Sub-pixel Structure HgCdTe Photovoltaic Detectors[J]. Infrared Technology , 2017, 39(6): 489-494.

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