Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing

JIN Xueyuan; CHEN Jinliang

Volume 45 Issue 12

Dec. 2023

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Infrared Technology > 2023 > 45(12): 1358-1363.

JIN Xueyuan, CHEN Jinliang. Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing[J]. Infrared Technology , 2023, 45(12): 1358-1363.

Citation:

JIN Xueyuan, CHEN Jinliang. Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing[J]. Infrared Technology , 2023, 45(12): 1358-1363.

Citation:

JIN Xueyuan, CHEN Jinliang. Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing[J]. Infrared Technology , 2023, 45(12): 1358-1363.

Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing

JIN Xueyuan^1,,
CHEN Jinliang²

1.
Public Experimental Teaching Center, Panzhihua University, Panzhihua 617000, China
2.
School of Vanadium and Titanium, Panzhuihua University, Panzhihua 617000, China

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Received Date: January 17, 2023
Revised Date: March 08, 2023

Graphical Abstract

Abstract

Abstract

To quantitatively detect defects using reflective continuous-heat-excited thermography, a heat conduction model of an object under continuous heat excitation was established, and the temperature increment-time relationship on the thermal excitation surface of the object was derived. Based on an analysis of the temperature increment-time relationship on the thermal excitation surface, the depth of the defects could be measured by nonlinear fitting of the temperature increment-time data. To test the feasibility of this method, a GFRP flat-bottomed hole specimen was fabricated and analyzed using reflective continuous-heat-excited thermography. The results show that this method is highly accurate in measuring the depth of defects.
- continuous-heat excited,
- nonlinear data fitting,
- reflective,
- heat conduction

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References (13)

References

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