Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System

ZHANG Lu; ZHANG Lei; FU Zhikai; TIAN Ya

Volume 43 Issue 12

Dec. 2021

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ZHANG Lu, ZHANG Lei, FU Zhikai, TIAN Ya. Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System[J]. Infrared Technology , 2021, 43(12): 1188-1192.

Citation:

ZHANG Lu, ZHANG Lei, FU Zhikai, TIAN Ya. Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System[J]. Infrared Technology , 2021, 43(12): 1188-1192.

ZHANG Lu, ZHANG Lei, FU Zhikai, TIAN Ya. Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System[J]. Infrared Technology , 2021, 43(12): 1188-1192.

Citation:

ZHANG Lu, ZHANG Lei, FU Zhikai, TIAN Ya. Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System[J]. Infrared Technology , 2021, 43(12): 1188-1192.

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Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System

North China Institute of Optoelectronic Technology, Beijing 100015, China

Received Date: 2021-08-19
Rev Recd Date: 2021-08-25
Publish Date: 2021-12-20

Abstract

Abstract

To test the low temperature MTF of infrared detectors integrated with an optical system inside a Dewar, a shell structure Dewar was designed. The inconvenient factors caused by the large size and complexity of the optical system is eliminated. The MTF test optical path was built to obtain the temperature distribution gradient of the integrated optical lens group, providing reliable data for the assembly accuracy and optical performance of the integrated optical lens group.
- integrated optical technology,
- optical lens group,
- low-temperature MTF evaluation

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References(6)

References

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