Hole Defect Detection Based on Genetic Algorithm and Sequence Infrared Thermography Weighted Stack
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引用本文: | 周建民, 刘波, 李鹏, 杨君. 基于遗传算法与时序红外热图加权叠加的孔洞缺陷检测[J]. 红外技术, 2014, (11): 896-899. |
Citation: | ZHOU Jian-min, LIU Bo, LI Peng, YANG Jun. Hole Defect Detection Based on Genetic Algorithm and Sequence Infrared Thermography Weighted Stack[J]. Infrared Technology , 2014, (11): 896-899. |