制冷型红外探测器插入式耦合传热结构可靠性研究

Reliability Study of Insertion-Coupled Heat Transfer Structure for Refrigeration-Type Infrared Detectors

  • 摘要: 基于大面阵或超大面阵制冷型红外探测器(下文简称探测器)小型化微杜瓦封装的应用需求,和宇航探测器长期在轨工作芯片加断电循环的工况,本文通过实验分析和理论计算研究了大直径冷指插入式耦合传热结构可靠性的影响因素。为保证宇航探测器长期在轨工作的可靠性,探测器的杜瓦插入式耦合传热结构设计考虑的主要因素有:杜瓦热端温度波动控制在±3℃以内;制冷机低温下冷指端面与杜瓦冷指内端面之间的仿真间隙<15 μm;制冷机冷指与杜瓦冷指的侧面间隙控制在0.05~0.15 mm之间,制冷机冷指铜帽顶面面积和侧面面积比小于40%;制冷机冷指端面和杜瓦冷指端面之间耦合添加铟片及导热脂并保证一定耦合过盈量。通过对上述因素的分析控制,我们进行了探测器大直径冷指插入式耦合组件制备及加断电长期工作,最终探测器完成7000多次加断电循环后仍正常工作。

     

    Abstract: In view of the application requirements of miniaturized micro-Dewar packaging for large- or ultra-large-array cooled infrared detectors (hereinafter referred to as detectors), as well as the long-term in-orbit operation and power cycling conditions of aerospace detectors, this study investigates the factors affecting the reliability of heat transfer coupling in large-diameter cold-finger insertion structures through experimental analysis and theoretical calculation. The results indicate that, to ensure the reliability of long-term in-orbit operation of space probes, several key factors must be considered in the design of the Dewar insertion-type coupled heat transfer structure of the detector. These include controlling the temperature fluctuation of the Dewar hot end within ± 3 ℃ and maintaining the simulated gap between the end face of the refrigeration cold finger and the inner end face of the Dewar cold finger below 15 μm at low temperatures. The side gap between the refrigeration machine cold finger and the Dewar cold finger should be controlled within the range of 0.05–0.15 mm, and the ratio of the top surface area to the side surface area of the refrigeration machine cold finger copper cap should be maintained below 40%. In addition, indium sheets and thermal grease are introduced at the interface between the end face of the refrigeration machine cold finger and that of the Dewar cold finger while ensuring an appropriate level of coupling interference. By analyzing and controlling the above factors, a large-diameter cold finger insertion coupling component for the detector was developed, and long-term operational testing with repeated power-on and power-off cycles was conducted. The results show that the detector completed more than 7000 cycles of power-on and power-off operations while maintaining normal functionality.

     

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