红外无损检测缺陷尺寸自动测量

Automatic Measurement Method for Defect Size by Infrared Thermography

  • 摘要: 缺陷尺寸测量一直是红外无损检测研究的热点,通常使用含所有缺陷的图像进行缺陷尺寸测量,但该方法将导致较大的测量误差;本文提出采用该缺陷对应的清晰图像进行测量,首先采用相关函数法把不同深度缺陷对应的清晰图像筛选出来,再利用半高宽测量算法实现对缺陷尺寸的自动测量。通过对不同深度的缺陷塑料试件测量表明:对于20 mm缺陷,使用含所有缺陷的图像,测量误差最大值12%,平均绝对值误差为6.1%,利用相关函数筛选出来的清晰图像进行缺陷尺寸测量,测量误差最大值6%,平均绝对值误差2.6%,采用本方法进行缺陷尺寸测量可有效提高测量精度。

     

    Abstract: Defect size measurement has always been a popular topic in infrared thermography. Typically, images containing all defects are used for defect size measurements, which leads to significant measurement errors. We propose using clear images corresponding to the defects for measurement. First, the correlation function method was employed to filter out clear images corresponding to defects at different depths. Then, the half-width measurement algorithm was applied to achieve automatic defect size measurement. By measuring plastic specimens with defects of varying depths, it was shown that for a 20 mm defect, using images containing all defects resulted in a maximum measurement error of 12% and an average absolute error of 6.1%. Using clear images selected by correlation functions for defect size measurement reduced the maximum measurement error to 6% and the average absolute error to 2.6%. This method can effectively improve the accuracy of defect size measurement.

     

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