Vibration Reduction of Infrared Detection Equipments on Airborne Platform
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摘要: 红外成像测量设备装载在飞机平台上测量地面目标,首先要解决的问题就是平台抖动及环境变化对设备稳定跟踪和成像清晰度的影响。本文针对机载平台抖动对设备跟踪测量的影响,采用被动隔离加主动陀螺稳定控制的技术,通过被动减振器隔离高频扰动,框架伺服系统抑制低频扰动,确保设备稳定跟踪、清晰成像。针对地面与空中环境温度变化对红外光学系统的影响,在光学镜头的设计中采用无热化补偿措施和调焦量补偿控制,确保设备清晰成像。通过仿真计算和外场测量证明,本文研究的减振措施合理有效,采用该措施研制的设备跟踪稳定、成像清晰,能够满足不同平台的挂飞测量任务。Abstract: Airborne infrared measurement systems are mounted on aircraft to track and measure the infrared characteristics of the ground target. The impact of platform jitter and environmental change must be addressed to achieve stable tracking and measurement accuracy. To this end, the technology of passive isolation and active gyroscopic stability control was used in this study to examine the influence of airborne platform jitter. To ensure stable tracking and imaging, the high-frequency disturbances were isolated through a passive shock absorber, and the low-frequency disturbances were suppressed through a frame servo system. Non-thermalization compensation calculation and focusing compensation control were adopted in the design of the optical lens to ensure clear imaging of the equipment and thus study the influence of the temperature change of the ground and air environment on the infrared optical system. Simulation calculations and field measurement demonstrated that these vibration reduction measures are reasonable and effective. The equipment thus developed is stable in tracking and clear in imaging. Therefore, it is suitable for realizing hanging flight measurement on different platforms.
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Keywords:
- infrared detection /
- airborne /
- vibration reduction /
- stability tracking
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表 1 试验条件参数表
Table 1 Test condition parameters
Vibration Impact Vibration conditions Sine sweep frequency Impact waveform Half-sine wave Frequency range 20 -500Hz Peak acceleration Vertical direction 20g, vertical axis direction 15g, lateral axis direction 15g Acceleration amplitude 2g Pulse duration 11ms Vibration direction Three axial Impact direction Three-axis six-way, 2 times per axial Vibration time 20-500-20 Hz for a scan, one scan time 15 min, 2 times per axial Else No power during the test Else Power up for performance testing at 2nd scans per axial axis during the test -
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