基于双光路中心偏测量仪的红外透镜同轴度、垂直度测量

Measurement of Coaxiality and Perpendicularity for Infrared Lenses Based on a Double Light-Path Center Deviation Measuring Instrument

  • 摘要: 中心偏差是光学透镜的一类重要指标,直接影响光学系统成像质量。对抛光完工透镜,除了面倾角、球心差和偏心差等指标外,设计师也常用同轴度、垂直度来表征透镜中心偏差,给透镜中心偏差的测量带来新的课题。在已有的面倾角、球心差和偏心差等测量技术基础上,基于双光路中心偏测量仪,提出一种红外透镜同轴度、垂直度的测量方法,分析了影响测量精度的因素,及采用同轴度、垂直度来表征透镜中心偏差的优势。采用该测量技术获得的同轴度、垂直度检验结果得到设计师的认可,并广泛应用于红外透镜的加工生产。

     

    Abstract: In optical lenses, central deviation is an important indicator that directly affects the imaging quality of optical systems. In addition to indicators such as face inclination angle, spherical center difference, and eccentricity difference for polished finished lenses, optical designers also commonly use coaxiality and perpendicularity to characterize lens central deviation, bringing new challenges to the measurement of lens central deviation. A method based on a double-light path center deviation measuring instrument is proposed, considering existing measurement techniques for face inclination angle, spherical center difference, and eccentricity difference, to measure the coaxiality and perpendicularity of infrared lenses. The factors affecting measurement accuracy, along with the advantages of using coaxiality and perpendicularity to characterize lens central deviation were analyzed. The test results obtained using the proposed method have been recognized by optical designers and are widely used in the processing and production of infrared lenses.

     

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