Drive-and-control Scheme for 512×512 MOS Resistor Array
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摘要: MOS电阻阵列是构成红外成像目标仿真系统的关键核心设备，其投射出的红外图像的质量将直接影响红外成像制导半实物仿真试验的逼真度和可信度。针对新一代国产512×512元MOS电阻阵列工作方式的改变、像元规模与图像数据传输量的倍增对驱动控制系统提出的更高要求，研究了与其配套的驱动控制方案。研究基于光纤数据传输、PCI-E高速总线、FPGA解决了高数据吞吐率、高精度时序信号生成问题，并设计了一种多路模拟信号高速建立的方法。经仿真验证表明，该驱动方案可满足512×512 MOS电阻阵列快照模式下图像刷新率达到200 Hz，单个像元灰度等级为16 bit，为电阻阵列的实际工程应用提供了参考。Abstract: The metal oxide semiconductor (MOS) resistor array is the key core device of infrared imaging target simulation systems. The quality of its projected infrared image directly affects the fidelity and reliability of infrared imaging guidance hardware-in-the-loop simulation tests. As the new generation domestic 512×512 MOS resistance array work mode and the multiplication of pixel scale and image data transmission resulted in higher requirements for drive control systems, the appropriate drive-and-control scheme was studied. The study was based on optical fiber data transmission and a PCI-Express high-speed bus and field programmable gate array. The problems of high data throughput and high-precision timing-signal generation were solved, and a high-speed establishment method for multi-channel analog signal was designed. The simulation verification showed that the drive-and-control scheme can reach a refresh rate of more than 200 Hz in the snapshot mode of the 512×512 MOS resistance array, and the gray-scale of each pixel was 16 bits. This study provides a reference for practical engineering applications of 512×512 MOS resistor array.
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Keywords:
- infrared imaging guidance /
- MOS resistor array /
- image refresh frequency /
- PCI-E bus /
- snapshot mode
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红外无损检测技术是一门跨学科、跨应用领域的创新性无损检测技术，具有非接触、检测速度快、检测精度与分辨率高、可靠性高等突出优点，已被广泛应用于航空、航天、风电、石化、电力等领域的工业材料与装备检测。近年来，人工智能、计算机科学、电子信息等科学技术的快速发展，不仅推动红外无损检测技术取得了巨大进步，也促使红外无损检测技术向着多样化、智能化、集成化等方向发展。
为了促进我国红外无损检测技术的创新发展，2023年10期，《红外技术》推出了“红外无损检测新技术”专栏，共收录7篇学术论文，内容涉及红外热成像技术在FRP复合材料热障涂层无损检测应用中的研究现状与进展，超声激励红外热成像研究现状与进展，基于YOLO v5的带涂层钢结构亚表面缺陷脉冲涡流热成像智能检测，基于脉冲红外热成像技术的锂电池端盖焊接质量检测，线激光扫描热成像无损检测参数仿真研究，滚动轴承红外热成像故障诊断与状态监测等，涉及内容广泛。旨在集中反映报道红外无损检测技术的最新动态和发展趋势，为我国相关科研人员和广大读者提供学术参考，为红外无损检测技术的创新发展提供一些新思路和新手段。
最后，感谢专栏论文所有作者和各位审稿专家的卓越贡献。
——郑凯 -
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图 2 光纤数据传输卡功能组成框图
Figure 2. Functional composition block diagram of fiber-optic data transmission card
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