短波红外机芯成像非均匀性与工作状态关系

Relationship Between the Imaging Non-Uniformity of Short-Wave Infrared Camera Core and the Working State

  • 摘要: 短波红外机芯组件运行工况具备可调特性,本文所指机芯工作状态,由积分时间、机芯温控温度、读出电路增益模式三类核心调控参数耦合构成,不同机芯运行工作状态下,短波红外焦平面成像非均匀性特征存在显著差异,提升了成像非均匀性校正难度。因此,本研究依托工程简化两点校正算法,探究多种机芯工作状态下短波红外图像成像非均匀特性演化规律,以期优化非均匀校正算法、提升红外成像画质。研究结果表明:积分时间、机芯温度与增益模式引发的机芯工作状态改变,均会显著影响短波红外成像非均匀性。常规两点校正算法虽可在固定工况下有效改善图像非均匀缺陷,但算法校正效能随机芯工作状态更迭出现衰减,多工况适配性有待优化。本研究探明了成像非均匀性随机芯工作状态的演变机理,可为短波红外成像系统非均匀校正算法优化提供理论支撑与工程实践参考。

     

    Abstract: Short-wave infrared camera cores have adjustable operating characteristics. The working state of the camera core defined in this study consists of three core control parameters: integration time, movement temperature, and readout integrated circuit gain mode. Different component working states produce distinct imaging nonuniformity characteristics of short-wave infrared focal plane arrays, which increase the difficulty of imaging nonuniformity correction. Therefore, based on the simplified engineering two-point correction algorithm, this study explores the evolution law of imaging nonuniformity under various component working states to optimize the nonuniformity correction algorithm and improve the infrared image quality. The experimental results demonstrate that the change in working states induced by the integration time, movement temperature, and gain mode significantly affected the imaging nonuniformity of short-wave infrared images. Although the conventional two-point correction algorithm can effectively eliminate imaging nonuniformity under a fixed working state, its correction efficiency decays with the change in working states, and multicondition adaptability requires further optimization. This study clarifies the evolution mechanism of imaging nonuniformity varying with component working states, which provides theoretical support and a practical engineering reference for the optimization of nonuniformity correction algorithms of short-wave infrared imaging systems.

     

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