Abstract: Owing to inherent material properties and chip fabrication processes, invalid pixels are inevitably present in infrared focal-plane arrays (IRFPAs), which degrade image quality and compromise target recognition in infrared imaging systems. Invalid pixels are classified into bad pixels and blinking pixels. Based on analysis of these two types, their underlying causes are investigated, and corresponding mitigation measures are proposed. The formation of invalid pixels is influenced by the defect density in mercury cadmium telluride (HgCdTe) epitaxial films and by process-induced defects during device fabrication. By enhancing the quality of both the substrate and the epitaxial layers, the material defect density can be significantly reduced, thereby lowering the count of invalid pixels. Meanwhile, process-induced defects can be effectively suppressed through optimized device processing and rigorous process control, further minimizing the occurrence of invalid pixels.