基于光抽运-太赫兹探测技术的CdTe光致载流子动力学特性研究

Photocarrier Dynamics of CdTe Measured by Optical-Pump Terahertz-Probe Spectroscopy

  • 摘要: 本文采用光抽运-太赫兹探测技术研究CdTe的载流子弛豫过程和瞬态电导率特性。在中心波长800 nm的飞秒抽运光激发下,CdTe的太赫兹最大瞬态吸收随抽运光密度的增加而增大,使用单指数函数对其载流子弛豫过程进行了拟合。CdTe的载流子弛豫时间长达几个纳秒,且随抽运光密度的增加而减小,这与深能级缺陷对电子的捕获有关,缺陷捕获延长了辐射复合时间。随抽运光密度增加,部分陷阱被填充,导致辐射复合时间减小。用Drude-Smith模型对CdTe的瞬态电导率进行了较好的拟合,其Smith参数c1随抽运光密度的增加由-0.7减小至-0.95,散射时间τS随抽运光密度的增加由155 fs增加至205 fs,说明CdTe的内部载流子运动不是自由散射而是被局域化的,且局域化程度随抽运光密度的增大而增强,这与CdTe的深能级缺陷对电子的局域有关。此研究为设计和制备碲化镉高速光电器件提供重要数据支撑和理论依据。

     

    Abstract: The ultrafast carrier dynamics and terahertz conductivity of cadmium telluride (CdTe) are investigated by optical-pump terahertz-probe spectroscopy at room temperature. The amplitude of the photoinduced absorption of CdTe increased gradually with the pump fluence under the femtosecond pumping excitation at 800 nm. The carrier-relaxation process was fitted with a single exponential function. The carrier relaxation process of CdTe takes several nanoseconds and decreases with the increase of pump energy density, which is related to the trapping of electrons by deep-level defects; the defect trapping prolongs the radiation recombination time. With the increase in the pumping optical density, part of the trap is filled, resulting in a decrease in the radiation recombination time. The Drude–Smith model was used to fit the transient composite photoconductivity of CdTe. With the increase in pump fluence, the Smith parameter c1 decreased from -0.7 to -0.95, and the scattering time τS increased from 155 fs to 205 fs, indicating that the internal carrier dynamics of CdTe is localized rather than freely scattered. The localization degree increased with pump fluence, which is related to the localization of CdTe deep-level defects on electrons. This study provides important data support and a theoretical basis for the design and fabrication of high-speed optoelectronic devices of CdTe.

     

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