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锑化物中/中波双色红外探测器研究进展

张宏飞 朱旭波 李墨 姚官生 吕衍秋

张宏飞, 朱旭波, 李墨, 姚官生, 吕衍秋. 锑化物中/中波双色红外探测器研究进展[J]. 红外技术, 2022, 44(9): 904-911.
引用本文: 张宏飞, 朱旭波, 李墨, 姚官生, 吕衍秋. 锑化物中/中波双色红外探测器研究进展[J]. 红外技术, 2022, 44(9): 904-911.
ZHANG Hongfei, ZHU Xubo, LI Mo, YAO Guansheng, LYU Yanqiu. Research Progress of Mid-/Mid-Wavelength Dual-color Antimonide-based Infrared Detector[J]. Infrared Technology , 2022, 44(9): 904-911.
Citation: ZHANG Hongfei, ZHU Xubo, LI Mo, YAO Guansheng, LYU Yanqiu. Research Progress of Mid-/Mid-Wavelength Dual-color Antimonide-based Infrared Detector[J]. Infrared Technology , 2022, 44(9): 904-911.

锑化物中/中波双色红外探测器研究进展

基金项目: 

航空科学基金项目 20200024012002

详细信息
    作者简介:

    张宏飞(1980-),男,工程师,主要从事武器装备质量监督及进展研究。E-mail:zhf2313@163.com

  • 中图分类号: TN215

Research Progress of Mid-/Mid-Wavelength Dual-color Antimonide-based Infrared Detector

  • 摘要: 面对第三代红外探测器对多波段探测的需求,中/中波双色同时获取两个波段的目标信息,对复杂的背景进行抑制,可以有效排除干扰源的影响,提高了探测的准确性,增强了在人工及复杂背景干扰下的目标识别能力,因此中/中波双色探测器设计和制备最近快速发展起来。锑化铟红外探测器通过分光可实现两个中波波段的探测,锑化物Ⅱ类超晶格探测器通过能带结构设计实现多波段探测。本文阐述了锑化物中/中波双色红外探测器的主要技术路线和目前研究进展,与传统InSb双色探测器相比,中/中波双色超晶格红外器件用于红外成像探测具有鲜明的特点和优势,但需要在探测器结构设计、锑化物超晶格材料生长、阵列器件制备等方面进行进一步研究,以提高探测性能,满足工程化应用需求。
  • 图  1  N-P-N器件结构图:(a)顺序型和(b)同时型

    Figure  1.  Schematics of N-P-N sequential structure (a) and simultaneous structure (b)

    图  2  并列式中/中波双色红外探测器成像

    Figure  2.  A fisheye image of hybrid dual-color MWIR detector

    图  3  InSb中波双色红外探测器滤光片方案

    Figure  3.  Filter deposition pattern of InSb MWIR detector

    图  4  InAs/GaSb中波双色红外探测器滤光片方案

    Figure  4.  Filter deposition pattern of InAs/GaSb dual-color MWIR detector

    图  5  不同像元尺寸的双色超晶格阵列器件表面照片

    Figure  5.  Sections of completely processed dual-color InAs/GaSb FPA with different pixel pitch

    图  6  双色InAs/GaSb超晶格器件结构图

    Figure  6.  Schematic view of a dual-color InAs/GaSb SL detector pixel

    图  7  双色器件结构及互连示意图

    Figure  7.  Schematic view of dual-color InAs/GaSb SL detector

    图  8  niBin结构的双色超晶格材料能带图

    Figure  8.  The band structure of the niBin device

    表  1  各种锑化物中/中波双色红外焦平面探测器的性能参数

    Table  1.   Specification of Mid-/Mid-Wavelength dual-color infrared detector performance

    Year Country Company or institute Materials Structure Array format Pixel Pitch/μm Working waveband/μm Peak Detectivity/
    (cm⋅Hz1/2⋅W-1)
    NETD/mK
    2012 Israel SemiConductor Devices (SCD) InSb Parallel 480×384 - - - -
    2017 Sweden IRnova AB InAs/GaSb Flat 320×256 30 3.0-3.5
    3.5-4.1
    - -
    2006 Germany Fraunhofer-Institute InAs/GaSb PIN Stack 384×288 40 3-4
    4-5
    - 29.5
    16.5
    2011 Germany Fraunhofer-Institute InAs/GaSb PIN Stack 384×288 30 3-4
    4-5
    - 17.9
    9.9
    2015 China Shanghai Institute of Technical Physics InAs/GaSb PIN Stack 320×256 30 3-4.2
    4.2-5.5
    6.0×1010
    2.3×109
    -
    2015 China Shanghai Institute of Technical Physics InAs/GaSb PIN Stack 640×512 30 3-4.5
    4.5-5.8
    7.73×1010
    7.81×1010
    -
    2017 China Institute of Semiconductors InAs/GaSb niBin Stack - - - - -
    下载: 导出CSV
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出版历程
  • 收稿日期:  2021-10-23
  • 修回日期:  2021-11-23
  • 刊出日期:  2022-09-20

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