Preliminary Study on Storage Life Distribution of Semiconductor Device Based on Weibull Distribution
-
摘要: 对有机电致发光二极管（Organic Light-Emitting Diode，OLED）微型显示器件进行90℃、80℃、70℃的高温贮存试验，获得产品的失效数据。基于威布尔分布模型，采用最小二乘法进行参数估计，对失效数据分析，获得OLED微型显示器件失效分布函数。应用经典可靠性理论，计算产品在90℃、80℃、70℃的特征寿命、可靠寿命及平均故障间隔时间（Mean Time Between Failure，MTBF）。采用Arrhenius模型，依据90℃、80℃、70℃的贮存特征寿命，获得常温下产品的贮存特征寿命。分析结果表明，该方法合理、简便、有效，数据结果可以进一步应用到推导产品常温贮存寿命。Abstract: In this study, a semiconductor device was tested for high temperature storage at 90℃, 80℃ and 70℃, and the failure data is obtained. Based on the Weibull distribution model, parameter estimation was carried out by the least square method. The failure distribution function of the semiconductor device was obtained. And the classical reliability theory was applied to calculate the characteristic life, reliable life and MTBF of the product at 90℃, 80℃ and 70℃. Using the Arrhenius model, the storage characteristic life of the semiconductor device at room temperature was obtained, according to the storage characteristic life of 90℃, 80℃ and 70℃. The results show that the method is reasonable, simple and effective, and the results can be used to derive the normal temperature storage life.
-
[1] 王忆锋, 唐利斌, 岳清. OLED器件寿命衰退模型的MATLAB分析计算[J].电子器件, 2010, 33(4): 412-415. http://www.cnki.com.cn/Article/CJFDTotal-DZQJ201004003.htmWANG Yifeng, TANG Libing, YUE Qing. MATLAB Analysis and Computation of OLED Lifetime Degradation Model[J]. Electron Devices, 2010, 33(4): 412-415. http://www.cnki.com.cn/Article/CJFDTotal-DZQJ201004003.htm [2] 张方晖, 席俭飞, 王秀峰.硫系玻璃薄膜封装层对OLED寿命的影响[J].半导体光电, 2010, 31(1): 30-33. http://www.cnki.com.cn/Article/CJFDTotal-BDTG201001008.htmZHANG Fanghui, XI Jianfei, WANG Xiufeng. Influence of Sulfide Glass Thin Film Encapsulation Layer on Lifetime of OLEDs[J]. Semiconductor Optoelectronics, 2010, 31(1): 30-33. http://www.cnki.com.cn/Article/CJFDTotal-BDTG201001008.htm [3] Eisenbrand F, Karrenbauer A, XU C. Algorithms for longer OLED lifetime[J]. Lecture Notes in Computer. Science, 2007, 4525: 338-351. doi: 10.1007/978-3-540-72845-0_26 [4] HAN C W, KIM H K, PANG H S, et al. Dual plate OLED display(DOD) embedded with white OLED[J]. J. Display Technol., 2009, 5(12): 541-545 doi: 10.1109/JDT.2009.2024009 [5] NElSON W B. Accelerated Life Testing-step-stress Model Sand Data Analysis[J]. IEEE Transactions on Reliability, 1980, 29(2): 103-108. [6] 陈循, 张春华, 汪亚顺, 等.加速寿命试验技术与应用[M].北京:国防工业出版社, 2013.CHEN Xun, ZHANG Chunhua, WANG Yashun, et al. Technology And Application of Accelerated Life Test[M]. Beijing: National Defence Industry Press, 2013. [7] ELSAYED A. Reliability Engineering[M]. 2nd (SECOND EDITION), 1984. [8] 陈光宇, 张文, 张小民.威布尔分布下系统全寿命周期成本建模与决策[J].系统工程理论与实践, 2016, 36(11): 2933-2940. http://www.cnki.com.cn/Article/CJFDTOTAL-XTLL201611020.htmCHEN Guangyu, ZHANG Chunhua, WANG Yashun. Modeling and decision-making of system lifecycle costs under Weibull distribution[J]. Systems Engineering-Theory & Practice, 2016, 36(11): 2933-2940. http://www.cnki.com.cn/Article/CJFDTOTAL-XTLL201611020.htm [9] ROLINK. Infrared Focal Plane Array Storage Life Assessment By Accelerated Aging[J]. Quality and Reliability Engineering International, 1998, 14(6): 425-432. doi: 10.1002/(SICI)1099-1638(199811/12)14:6<425::AID-QRE226>3.0.CO;2-J [10] 蒋仁言.可靠性模型及应用[M].北京:机械工业出版社, 1999.JIANG Renyan. Reliability Model and Application[M]. Beijing: China Machine Press, 1999. [11] 赵宇.可靠性数据分析[M].北京:国防工业出版社, 2014.ZHAO Yu. Reliability Data Analysis[M]. Beijing: National Defence Industry Press, 2014. -
下载:
点击查看大图
图(3)
计量
- 文章访问数: 277
- HTML全文浏览量: 122
- PDF下载量: 25
- 被引次数: 0
