Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System
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摘要: 红外探测器集成光学技术是将部分成像光学系统集成在杜瓦结构内部，以保证F数较小、探测目标信号能量大的同时，消除光学系统体积庞大和复杂带来的不便因素。本文研究的红外探测器集成光学低温评价技术是在不反复拆除杜瓦的前提下，直接评估集成光学系统低温MTF，缩短测试周期。进行集成光学透镜组精密装配，在此基础上开发独立的集成光学系统低温MTF评价装置，并搭建MTF测试光路，获得集成光学透镜组温度分布梯度，为集成光学透镜组的装配精度和光学性能提供可靠数据。Abstract: To test the low temperature MTF of infrared detectors integrated with an optical system inside a Dewar, a shell structure Dewar was designed. The inconvenient factors caused by the large size and complexity of the optical system is eliminated. The MTF test optical path was built to obtain the temperature distribution gradient of the integrated optical lens group, providing reliable data for the assembly accuracy and optical performance of the integrated optical lens group.
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图 3 ANSYS仿真透镜组温度梯度分布
Figure 3. Temperature gradient distribution of simulated lens group by ANSYS
图 6 集成光学透镜组低温MTF测试杜瓦管壳结构示意图
注：1. 中测杜瓦；2.窗座压环；3. 杜瓦冷台；4. 窗座；5. 内置集成光学透镜组支架；6. 内置光学透镜组部件
Figure 6. Schematic diagram of Dewar shell structure tested by integrated optical lens group at low temperature MTF
Note: 1.Test dewar 2. Window seat ring 3. Dewar in cold 4. Window cup 5.Support 6. Built-in optical lens group components
图 7 集成光学MTF测试杜瓦冷头结构示意图
注：1. 窗口透镜；2. 调整环；3. 窗座；4. 内置光学透镜组部件；5. 支架；6. 封口环；7. 平面透镜
Figure 7. Diagram of dewar cold head structure tested by integrated optical MTF
Note: 1.Window group 2. Adjusting ring 3. Window cup 4. Built-in optical lens group components 5. Support 6. Sealed ring 7. Plano spherical lens
图 10 集成光学透镜组低温MTF测试原理图
Figure 10. Diagram of integrated optical lens group low temperature MTF test
表 1 温度测量结果
Table 1. Temperature measurement results
Diode position Result of first diode group/V Result of second diode group/V Result of third diode group/V Average/V Corresponding temperature/K Diode1 1.035 1.037 1.033 1.035 91.934 Diode2 1.032 1.030 1.031 1.031 94.232 Diode3 1.028 1.027 1.029 1.028 96.226 
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