[1]李赜浩,廖守亿,张作宇.基于PSF估计的电阻阵列非均匀校正[J].红外技术,2020,42(1):086-92.[doi:1001-8891(2020)01-0086-07]
 LI Zehao,LIAO Shouyi,ZHANG Zuoyu.Nonuniformity Correction of Resistance Array Based on Estimation of Point Spread Function[J].Infrared Technology,2020,42(1):086-92.[doi:1001-8891(2020)01-0086-07]
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基于PSF估计的电阻阵列非均匀校正
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《红外技术》[ISSN:1001-8891/CN:CN 53-1053/TN]

卷:
42卷
期数:
2020年第1期
页码:
086-92
栏目:
出版日期:
2020-01-23

文章信息/Info

Title:
Nonuniformity Correction of Resistance Array Based on Estimation of Point Spread Function

文章编号:
1001-8891(2020)01-0086-07
作者:
李赜浩廖守亿张作宇
火箭军工程大学 控制科学与工程系
Author(s):
LI ZehaoLIAO ShouyiZHANG Zuoyu
Department of Control Science and Engineering, Rocket Force University of Engineering
关键词:
点扩散函数莫尔条纹全屏测试法试验估计法映射比
Keywords:
?
分类号:
TN215
DOI:
1001-8891(2020)01-0086-07
文献标志码:
A
摘要:
电阻阵列红外仿真技术至今已发展为一项较为成熟的红外成像仿真方法,不仅像元规模越来越大,制造工艺水平也越来越高。尤其是国外,已研制出大规模商用电阻阵列器件,并在众多武器系统研制过程中得到了应用;国内在该方面同样取得了较大的进步,但是在传统的非均匀测试方法上国内研究还存在一些遗留问题未得到很好的解决。如实验中出现的莫尔条纹、边缘效应、映射与对准等相关难题很少有研究者提出详尽可行的处理措施。本文针对莫尔条纹和边缘效应问题,提出了一种基于点扩散函数估计的迭代非均匀性测试方法,实现了条纹干扰和边缘效应的去除。此外,本文对于映射比大于1:1的情况进行了仿真验证,对比了不同映射比和不同非均匀程度对校正效果的影响,给出了进行下一步实验的理论基础。
Abstract:
The infrared simulation technology of resistance array has been developed into an established infrared imaging simulation method, which not only has a larger scale but also employs a higher level of manufacturing technology. Large-scale commercial resistor array devices have been developed and applied in the development of several weapon systems, especially in foreign countries. Domestically, considerable progress has been made in this aspect, but some legacy issues related to research on traditional nonuniformity testing methods have not been well resolved. For example, Moiré fringes, edge effects, mapping, and alignment problems appear in experiments, and few researchers have proposed detailed and feasible treatment measures. In this study, an iterative nonuniformity test method based on point spread function estimation is proposed for solving the problems of Moiré fringes and edge effects. In addition, the simulation verification of the mapping ratio exceeding 1:1 is carried out. The effects of different mapping ratios and nonuniformities on the correction effect are compared, and the theoretical basis for the next experiment in this study is given.

参考文献/References:

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备注/Memo

备注/Memo:
收稿日期:2019-05-21;修订日期:2019-12-31.
作者简介:李赜浩(1995-),男,湖南岳阳人,硕士在读,主要研究方向为导航、制导与仿真方面研究。E-mail:183435120@qq.com。
基金项目:航空科学基金(201601U8001)。

更新日期/Last Update: 2020-01-20