[1]拜晓锋,郭 晖,杨书宁,等.用于准确预测微光像增强器寿命的光灵敏度测量技术[J].红外技术,2018,40(12):1121-1124.[doi:10.11846/j.issn.1001_8891.201912001]
 BAI Xiaofeng,GUO Hui,YANG Shuning,et al. Integral Sensitivity Measurement Technique for Accurately Predicting the Lifetime of a Low-light-level Image Intensifier[J].Infrared Technology,2018,40(12):1121-1124.[doi:10.11846/j.issn.1001_8891.201912001]
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用于准确预测微光像增强器寿命的光灵敏度测量技术
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《红外技术》[ISSN:1001-8891/CN:CN 53-1053/TN]

卷:
40
期数:
2018年第12期
页码:
1121-1124
栏目:
出版日期:
2018-12-21

文章信息/Info

Title:
 Integral Sensitivity Measurement Technique for Accurately Predicting the Lifetime of a Low-light-level Image Intensifier
文章编号:
1001-8891(2018)12-1121-04
作者:
拜晓锋12郭 晖12杨书宁1朱宇峰12石 峰12侯志鹏12黄武军1孟庆运1
1. 昆明物理研究所,云南 昆明 650223;2. 微光夜视技术重点实验室,陕西 西安 710065
Author(s):
BAI Xiaofeng12GUO Hui12YANG Shuning1ZHU Yufeng12SHI Feng12HOU Zhipeng12 HUANG Wujun1MENG Qingyun1
1. Kunming Institute of Physic, Kunming 650223, China;
2. Science and Technology on Low-light-level Night Vision Laboratory, Xi’an 710065, China
关键词:
光阴极光灵敏度微光像增强器寿命测量误差
Keywords:
photocathodeintegral sensitivitylow-light-level image intensifierlifetimemeasurement error
分类号:
TN223
DOI:
10.11846/j.issn.1001_8891.201912001
文献标志码:
A
摘要:
光阴极光灵敏度的测量误差大小对微光像增强器寿命预测结果影响很大,高精确度的光灵敏度测量可以实现微光像增强器寿命的准确预测。本文通过分析光阴极光灵敏度测量原理、方法和装置特性,利用光灵敏度误差分配方法,在保证满足寿命预测所需光灵敏度测量误差的前提下,确定了一种合成测量误差为3.8%的光灵敏度测量方案,基于该方案预测的微光像增强器寿命与实际寿命试验验证结果的相对偏差不超过2%,为提高微光像增强器的工程研制效率提供了有效的检测手段。
Abstract:
The measurement error of the photocathode integral sensitivity has a considerable influence on the life prediction result of the low-light-level image intensifier. Highly accurate integral sensitivity measurements enable accurate prediction of the life of the low light level image intensifier. In this paper the principle, method and device characteristics of photocathode sensitivity measurement, using integral sensitivity error distribution method, under the premise of ensuring the integral sensitivity measurement error required for life prediction was analyzed. An integral sensitivity measurement scheme with a synthetic measurement error of 3.8% was determined. The relative deviation between the life of the low-light-level image intensifier and the actual life test verification result predicted by the scheme is less than 2%. The given method provides an effective means of detecting the engineering development efficiency of the low-light-level image intensifier.

参考文献/References:

[1] 田金生. 二代增像管及其工作寿命的预测[J]. 红外技术, 1989, 11(3): 35-41.
TIAN Jinsheng. Prediction to operation life of second image intensifier tube [J]. Infrared Technology, 1989, 11(3): 35-41.
[2] 汤文梅. 超二代微光像增管加速工作寿命试验探讨[D]. 南京: 南京理工大学, 2008: 8-10.
TANG Wenmei. Analysis to accelerated operation life of the super second low light level image intensifier tube[D]. Nanjing: Nanjing University of Technology, 2008: 8-10.
[3] 徐家诚, 杨秀. MIL-I-49052D的工作寿命预测方法简介[J]. 兵工标准化, 1998(1): 38-39.
XU Jiacheng, YANG Xiu. Introduction to operation life prediction method of MIL-I-49052D [J]. Ordnance Standardization, 1998(1): 38-39.
[4] 向世明, 倪国强. 光电子成像器件原理[M]. 北京: 国防工业出版社, 2006.
XIANG Shiming, NI Guoqiang. Optoelectronic Image Device Principle [M]. Beijing: National Defense Industry Press, 2006.
[5] 中国兵器工业标准化研究所. GJB 2000-1994像增强器通用规范[S]. 北京: 国防科工委军标出版发行部, 1994.
China Ordnance Industry Standardization Institute. GJB 2000-1994 General specification for image intensifier assembly [S]. Beijing: National Defense Science and Technology Commission Military Standards Publishing Department, 1994.
[6] 中国兵器工业标准化研究所. GJB 5984-2007三代像增强器规范[S]. 北京: 国防科工委军标出版发行部, 2007.
China Ordnance Industry Standardization Institute. GJB 5984-2007 Specification for generation Ⅲ image intensifier assembly[S]. Beijing: National Defense Science and Technology Commission Military Standards Publishing Department, 2007.
[7] 费业泰. 误差理论与数据处理[M]. 北京: 机械工业出版社, 2010.
FEI Yetai. Error Theory and Data Processing[M]. Beijing: Mechanical Industry Press, 2010.
[8] 中国国家标准管理委员会. GB/T 26178-2010 光通量的测量方法[S]. 北京: 中国标准出版社, 2010.
China National Standards Management Committee. GB/T 26178-2010 The measurement of luminous flu[S]. Beijing: China Standard Press, 2010.

相似文献/References:

[1]倪小兵,杨晔,延波,等.三代微光像增强器光阴极保护方法研究[J].红外技术,2018,40(5):492.[doi:10.11846/j.issn.1001_8891.201805016]
 NI Xiaobing,YANG Ye,YAN Bo,et al.Research on Photocathode Protection Method of the Three-Generation Image Intensifier[J].Infrared Technology,2018,40(12):492.[doi:10.11846/j.issn.1001_8891.201805016]

备注/Memo

备注/Memo:
收稿日期:2018-07-11;修订日期:2018-07-31.
作者简介:拜晓锋(1982-),男,陕西大荔人,博士研究生,高级工程师,主要从事微光像增强器性能评价技术及微光器件的系统应用技术研究。E-mail:baixiaofeng2001@163.com
基金项目:总装实验室基金。
更新日期/Last Update: 2018-12-19